[Thin-Films] – Watching the evolution of nanostructures in thin films
7 September 2023
Scientists make extensive use of X-ray fluorescence to map elements in materials. However, this technique does not have the needed spatial sensitivity unless the probe is finely focused.
Scientists have now found a way to turn X-ray fluorescence into an ultra-high position-sensitive probe to measure tiny internal structures called nanostructures in thin films (Nature Communications, “Reconstruction of Evolving Nanostructures in Ultrathin Films with X-ray Waveguide Fluorescence Holography”). These thin films can be a hundred times finer than a human hair.
[Thin-Films] – New process boosts efficiency of bifacial CIGS thin film solar cell
20 November 2023
Bifacial thin film solar cells based on copper indium gallium diselenide or CIGS can collect solar energy from both their front and their rear side…
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