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[Thin-Films] – Watching the evolution of nanostructures in thin films
7 septembre 2023
Scientists make extensive use of X-ray fluorescence to map elements in materials. However, this technique does not have the needed spatial sensitivity unless the probe is finely focused.
Scientists have now found a way to turn X-ray fluorescence into an ultra-high position-sensitive probe to measure tiny internal structures called nanostructures in thin films (Nature Communications, « Reconstruction of Evolving Nanostructures in Ultrathin Films with X-ray Waveguide Fluorescence Holography »).
